test.h
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#define MSGAREA IOAREA
#define PRINT(X) set MSGAREA, %o0; ld [%o0 + X*4], %g0
#define FAIL(X) set MSGAREA, %o0; st %g0, [%o0 + X*4]
#define SYS_TEST 0
#define CACHE_TEST 1
#define REG_TEST 2
#define MUL_TEST 3
#define DIV_TEST 4
#define WATCH_TEST 5
#define SNOOP_TEST 6
#define FPU_TEST 7
#define PCI_TEST 8
#define RAM_INIT 9
#define IRQ_TEST 10
#define TIMER_TEST 11
#define UART_TEST 12
#define PIO_TEST 13
#define EDAC_TEST 14
#define DMA_TEST 15
#define DPRAM_TEST 16
#define CRAM_TEST 17
#define MEM_TEST 18
#define TEST_END 19
#define WP_TEST 20
#define DSU_TEST 21
#define MMU_TEST 23
#define ITAG_VALID_MASK ((1 << ILINESZ) -1)
#define ITAG_MAX_ADDRESS ((1 << ITAG_BITS) -1) << (ILINEBITS + 2)
#define DTAG_VALID_MASK ((1 << DLINESZ) -1)
#define DTAG_MAX_ADDRESS ((1 << DTAG_BITS) -1) << (DLINEBITS + 2)
#ifndef __ASSEMBLER__
extern struct lregs *lr;
extern int test;
#endif